Product Overview
XGT-5700WR are new lineup of XGT-5000WR series and equipped with new optical system to analyze hazardous elements with high sensitivity. XGT-5700WR support for WEEE/RoHS, ELV and Chinese RoHS
These models have 3mm XGT with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and 100 µm XGT as standard and 10 µm is optional instead of 100 µm. Secondary filter(between sample and detector) with ON/OFF positions are also equipped. Improved detection sensitivity is realized through the use of a dual filter. Compliant with WEEE/RoHS, ELV Chinese RoHS directives
XGT-5700WR is equipped with dewar of liquid nitrogen. XGT-5700WR Type S/SL model with big sample room are lineuped.
Product Features
*
Increased detection sensitivity with a new optical system
3mm X-ray irradiation diameter and dual filter system (Primary and Secondary filters)
* Capable of both minute area analysis and high sensitivity analysis
Minute area analysis: 10(with no filter) or 100 µm (with no filter) X-ray irradiation diameter
High sensitivity analysis: 3mm X-ray irradiation diameter and dual filter system
*
Maintains the same ease of operation as previous systems to promote efficient on-site work
Preset measuring conditions for materials ranging from resins to metals
A lineup of data management software is available that is compatible with various data format
Can be used to analyze hazardous elements in Ni and Sn plating (When using the multilayer film FPM option)
*
Internal analysis using element mapping for minute area and transmission image
Applications ranging from point measurement to surface measurement
Monday, January 5, 2009
XGT-5000WR X-ray Analytical and Imaging Microscope
Product Overview
XGT-5000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions
With the unique X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2mm down to 10 µm(HORIBA original). Two X-ray guide tubes(1.2mm and 100 µm are standard, 10 µm is optional instead of 100 µm) are provided in the instrument, allowing the user to simply switch between a micro and macro beams, so that a range of experiments can be accommodated.
There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure.
Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
XRF mapping images are easily obtained through automated sample scanning, and the provision of a second detector beneath the sample enables simultaneous acquisition of X-ray transmission images. The additional structural information provided by this technology is extremely useful for locating regions of interest, or interrogating a sample's internal structure.
XGT-5000WR is equipped with dewar of liquid nitrogen.
XGT-5000WR Type S/SL model with big sample room are lineuped.
Product Features
*
Various type of analysis are possible with just one unit
*
Screening analysis of harmuful elements
*
Simple, Accurate Sample Positioning
*
Compatible with a wide-range of sample size from micro to macro sample
*
The XGT solves various analytical problems and difficulties
XGT-5000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions
With the unique X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2mm down to 10 µm(HORIBA original). Two X-ray guide tubes(1.2mm and 100 µm are standard, 10 µm is optional instead of 100 µm) are provided in the instrument, allowing the user to simply switch between a micro and macro beams, so that a range of experiments can be accommodated.
There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure.
Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
XRF mapping images are easily obtained through automated sample scanning, and the provision of a second detector beneath the sample enables simultaneous acquisition of X-ray transmission images. The additional structural information provided by this technology is extremely useful for locating regions of interest, or interrogating a sample's internal structure.
XGT-5000WR is equipped with dewar of liquid nitrogen.
XGT-5000WR Type S/SL model with big sample room are lineuped.
Product Features
*
Various type of analysis are possible with just one unit
*
Screening analysis of harmuful elements
*
Simple, Accurate Sample Positioning
*
Compatible with a wide-range of sample size from micro to macro sample
*
The XGT solves various analytical problems and difficulties
XGT-1700WR X-ray Fluorescence Analyzer
Product Overview
Maintain the same system as XGT-1000WR and high sensitivity type due to new optical system. XGT-1700WR support for WEEE/RoHS, ELV and Chinese RoHS.
XGT-1700WR our new lineup of XGT-1000WR series and equipped with new optical system to analyze hazardous elements with high sensitivity.
These models use an X-ray guide tube to generate a 3mm irradiation beam with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and secondary filter(between sample and detector) with ON/OFF positions are equipped. Improved detection sensitivity is realized through the use of a dual filter.
These have possibility to equip 100 µm or 1.2mm X-ray guide tube as optional XGT. Compliant with WEEE/RoHS, ELV Chinese RoHS directives.
XGT-1700WR is equipped with dewar of liquid nitrogen.
Product Features
* Increased detection sensitivity with a new optical system3mm X-ray irradiation diameter and dual filter system (Primary and Secondary filters)
* Capable of both minute area analysis and high sensitivity analysis
Minute area analysis(Optional): 100 µm (with no filter) or 1.2mm(with filters for simultaneously analyzing 5 elements or no filter) X-ray irradiation diameter
High sensitivity analysis: 3mm X-ray irradiation diameter and dual filter system
* Maintains the same ease of operation as previous systems to promote efficient on-site work
* Preset measuring conditions for materials ranging from resins to metals
A lineup of data management software is available that is compatible with various data format
* Can be used to analyze hazardous elements in Ni and Sn plating (When using the multilayer film FPM option)
Maintain the same system as XGT-1000WR and high sensitivity type due to new optical system. XGT-1700WR support for WEEE/RoHS, ELV and Chinese RoHS.
XGT-1700WR our new lineup of XGT-1000WR series and equipped with new optical system to analyze hazardous elements with high sensitivity.
These models use an X-ray guide tube to generate a 3mm irradiation beam with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and secondary filter(between sample and detector) with ON/OFF positions are equipped. Improved detection sensitivity is realized through the use of a dual filter.
These have possibility to equip 100 µm or 1.2mm X-ray guide tube as optional XGT. Compliant with WEEE/RoHS, ELV Chinese RoHS directives.
XGT-1700WR is equipped with dewar of liquid nitrogen.
Product Features
* Increased detection sensitivity with a new optical system3mm X-ray irradiation diameter and dual filter system (Primary and Secondary filters)
* Capable of both minute area analysis and high sensitivity analysis
Minute area analysis(Optional): 100 µm (with no filter) or 1.2mm(with filters for simultaneously analyzing 5 elements or no filter) X-ray irradiation diameter
High sensitivity analysis: 3mm X-ray irradiation diameter and dual filter system
* Maintains the same ease of operation as previous systems to promote efficient on-site work
* Preset measuring conditions for materials ranging from resins to metals
A lineup of data management software is available that is compatible with various data format
* Can be used to analyze hazardous elements in Ni and Sn plating (When using the multilayer film FPM option)
Subscribe to:
Posts (Atom)